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Research papers

Retailer's panel and expert system

We show how using one expert system allows us to go further and quicker in the analysis of the enormous amount of data collected by scanner in a sample of stores. In particular the first step of our research is to be able to condense, to structure...

Catalogue: Seminar 1990: How To Cope With Data Overload
Authors: Jean Pierre Gaucher, Patrick Le Maire, Isabelle Le Roy, Gilles Mauffrey, Jacques Obadia
June 15, 1990